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We know eventually everything is transistors which have state 0 and 1.
And the transistor may be damaged sometimes.
Can we test if there’s any bit of defect transistors in the memory?
I think it’s similar for hardware or anything else.
You can’t make a definite decision from a process whether a memory cell is bad or not. The way this is usually done by writing known values to memory addresses and checking if they’re identical when read back in. Tools like memtest86 work on that principle.